IEEE VIS 2018 in Berlin

Torsten Möller, Thomas Torsney-Weir, Raphael Sahann, Christoph Kralj, Rene Cutura and Dominic Böhm attended the IEEE Visualization Conference in Berlin last week.

They had an amazing week with very interesting presentations, great discussions and the opportunity to network with fellow researchers.

The full program can be found here: http://ieeevis.org/attachments/vis18-program.pdf